DOI: https://doi.org/10.30970/jps.02.105
THE ELECTROPHYSICAL PROPERTIES OF THIN POLYCRYSTALLINE Cr, Cu, Ni AND Ti FILMS
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Journal of Physical Studies 2(1), 105–108 (1998)
DOI: https://doi.org/10.30970/jps.02.105 THE ELECTROPHYSICAL PROPERTIES OF THIN POLYCRYSTALLINE Cr, Cu, Ni AND Ti FILMS |
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I. Yu. Protsenko, O. V. Shovkoplyas, Yu. M. Ovcharenko, N. M. Opanasyuk
Sumy State University, 2 Rymskyi-Korsakov Str., Sumy, UA-244007, Ukraine
A study of size effect in temperature resistance coefficient and tension sensitivity coefficient of Cr, Cu, Ni, and Ti has been undertaken. The electrical transport parameters $λ _g, R, r, p, η _l$, were calculated. The change of TCR in films with the overlayer is connected with a partial change of specularity reflection parameter of surface film and specular transmission coefficient of grain boundary which is connected with the codiffusion of the overlayer atoms.