Journal of Physical Studies 13(1), Article 1602 [5 pages] (2009) DOI: https://doi.org/10.30970/jps.13.1602 POST-RADIATION DEGRADATION-RELAXATION TRANSFORMATION IN CHALCOGENIDE GLASS SEMICONDUCTORS: PHENOMENOLOGY OF KINETICS AND POSSIBLE MICROSTRUCTURES MECHANISMS M. M. Vakiv Scientific Research Company ‟Carat”, 202, Stryjska St., Lviv, UA--79031, Ukraine PACS number(s): 61.43.Bn, 81.20.Wt, 61.43.Dq pdf