Journal of Physical Studies 16(1/2), Article 1701 [4 pages] (2012) DOI: https://doi.org/10.30970/jps.16.1701 MODELLING OPTICAL SPECTRA OF INSULAR SILVER FILMS FROM AFM DATA I. Bolesta, A. Borodchuk, O. Kushnir Ivan Franko National University of Lviv, Electronics Departament, Scientific-Educational Center ‟Fractal”, 50, Drahomanov St., Lviv, UA--79005, Ukraine

We calculated the transmittance spectra of silver ultrathin films, deposited on glass substrates in the statistical model. The structural parameters of films required for calculation were obtained using atomic force microscopy. From the comparison of the calculated and experimental spectra we determined the effective permittivity of the medium $ε_ {m}$, optical thickness of the films $d_ {\rm opt}$ and phenomenological parameter $A$ which describe the size dependence of the dielectric conductivity of silver.

PACS number(s): 78.66.Bz, 36.40.Gk, 78.20.-e

pdf