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Journal of Physical Studies 14(4), Article 4401 [11 pages] (2010)
DOI: https://doi.org/10.30970/jps.14.4401 CONDITIONS FOR THE EXTREMAL REFLECTION OF MULTILAYER STRUCTURES: APPLICATION FOR DESIGNING OF NARROW BANDPASS FILTERSO. P. Kushnir
Lviv National Agrarian University, Physics Department, |
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The conditions for zero reflection of weakly absorbing multilayer structures as well as those for the maximal reflection of transparent structures with an absorbing substrate have been determined. For the instrumentality of these conditions used for transparent multilayer structures two different methods of the designing of the narrow bandpass filters with one or more bandpasses have been proposed. The obtained methods can also be used for designing filters with ultra-narrow bandpasses. One of these methods provides a more narrow bandpass at the use of the same total number of layers, but in the second method smaller values of shape factors are reached. The possibility of designing filters with an arbitrary position of the narrow bandpass within the rejection band is shown.
PACS number(s): 42.79.Wc, 78.20